[Chunlei Xia, Jang-Myung Lee, Yan Li,
Bu-Keun Chung, Tae-Soo Chon]
"In
situ detection of small-size insect pests sampled on traps using multifractal
analysis"
SPIE-The International Society for Optical Engineering, ISSN 0091-3286, Opt. Eng. 51, 027001, Mar 2012. (IF:0.959) SCIE
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